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Nano-Indentation Tester

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Features of the Nano-Indenter

  • Hardness & Young's modulus.
  • Automatic operation under Windows XP.
  • Spherical, Vickers and Berkovich nano-indentations.
  • Dynamic Mechanical Analysis for visco-elastic properties
  • Creep, fatigue & fracture toughness tests
  • Mapping of indents.
  • Optional High and Low Temperature Testing
  • AFM/SPM objective for nanometer scale imaging of indents.
  • Possibility to add Nano Scratch, Micro Scratch and Micro Hardness modules.

Laboratory services available. Call 1-866-333-4674 for more information.

 

Introduction to the Nanovea Nano-Indentation Tester
The Nanovea Nano-Indentation Tester is a high precision instrument for the determination of the nano mechanical properties of thin films, coatings and substrates. With the Nanovea Nano-Indentation Tester you can quickly determine properties such as hardness and Young's modulus on almost any type of material - soft, hard, brittle or ductile. 

The Nanovea Nano-Indentation Tester works on the following principle. An indenter tip (Berkovich, Sphero-conical, Knoop or cube corner), normal to the sample surface, with a known geometry is driven into the sample by applying an increasing load up to some preset value. The load is then gradually decreased until partial or complete relaxation of the sample has occurred. The load and displacement are recorded continuously throughout this process to produce a load displacement curve from which the nano-mechanical properties such as hardness, Young's modulus, stress-strain studies, time dependant creep measurement, fracture toughness, plastic & elastic energy of the sample material can be calculated. The Nanovea Nano Indentation Tester can be used in a mapping mode to take data automatically from a variety of locations on your sample. 


Instrumented Indentation Analysis Software
The indentation software offers the traditional Oliver & Pharr method of analysis.


• User friendly
• ISO 14577
• Analysis of data from Berkovich, Vickers, spherical and cube corner indenters
• Automatic calculation of hardness & elastic modulus
• Creep
• Elastic-Plastic material properties
• Positioning of each indent with the microscope
• Images from color camera directly incorporated in the file
• Mapping of indentation
• Export in ASCII format
• Free program updates
 

info@nanovea.com 

 

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Thin Film Analysis

Micro Photonics Inc.
PO Box 50443
Irvine, CA 92619-0443

Micro Photonics Inc. 
PO Box 3129 
Allentown, PA 18106-0129